1b. ACI: X-Ray Spectroscopy\Microscopy: ACI: FE-SEM with EDX, JSM7900FLV/X-Max80

What is it?
Scanning Electron Microscopy (SEM) is a high-resolution technique that allows investigations on nanometer-scale surface about a material. SEM uses a focused scanned electron beam and various detectors to collect signals produced by electron-matter interactions from sample surface.

Manufacturer: JEOL/Oxford

Model Name: JSM7900FLV/X-Max80

Applications: Topography: The surface features of an object and its texture Morphology: The shape and size of the particles making up the object Compositional: Elements and compounds and relative amounts.

Instrument Overview: JSM-7900F combines ultra-high resolution imaging with various functions such as GentleBeam, Low Vacuum and Energy Dispersive X-Ray Spectroscopy (EDS).

Technical features and specifications:
Resolution: 0.6nm (15kV), 0.7nm (1kV), 1.0nm (0.5kV)
Magnification: 25 to 1,000,000 (direct)
Accelerating voltage: 0.01 to 30kV
Probe Current: Few pA to 500nA
Electron gun: In-lens Schottky Plus field emission
Detectors: Upper Electron Detector (UED), Lower Electron Detector (LED), Retractable BE Detector (RBED) Low Vacuum Function (LV) / GentleBeam (GBSH) EDS Detector Resolution of 129eV (X-Max80)

Charges: NA

Instrument Manufacturer URL:
https://www.jeol.co.jp/en/products/detail/JSM-7900F.html

Detailed Specifications: NA