1b. ACI: X-Ray Spectroscopy\Microscopy: ACI: FE-TEM with EDS/EELS/Cryo, JEM2200FS

What is it?
Transmission Electron Microscopy (TEM) is an advanced microscopy technique that allows increased understanding of material properties where details down to nanoscale and atomic level can be revealed.

Manufacturer: JEOL/Gatan

Model Name: JEM2200FS

Applications: JEOL JEM-2200FS in ICES is an analytical grade transmission electron microscope (TEM) that allows elemental and chemical analyses of specimens. It can obtain TEM point resolution of 0.23 nm / lattice resolution of 0.1 nm, and STEM resolution of 0.20 nm at 200 kV. Zero-loss images and energy filtered images are also obtainable using its built-in omega energy filter to provide valuable research information. TEM is capable of studying for nanoparticles, protein complexes, liposomes, ultra-thin sections of cells and tissues. It is equipped with 200kV field emission gun (FEG), high resolution (HR) pole piece, in-column omega energy filter, JED-SDD100 EDS detector (100mm2 sensor size), cryogenic holder and full suite of tomography controls and reconstruction software. In addition, user can also make use of this system to acquire TEM images, high angle annular dark field (HAADF) STEM images, bright field STEM images, 3D tomography TEM/STEM images. Specimen that need cryogenic temperature condition for observation is also available.

Instrument Overview: JEOL JEM-2200FS system is coupled with various analytical capabilities that range from Cryo-EM technique, Energy-dispersive X-ray spectroscopy (EDS) analysis, 3D tomography for both TEM/STEM images and elemental maps, and an in-column omega energy filter for electron energy-loss spectroscopy (EELS). It has a TEM point resolution of 0.23nm, lattice resolution of 0.1nm and STEM resolution of 0.20 nm at 200kV.

Technical features and specifications:
JEM-2200FS
200kV field emission gun (FEG)
In-column omega energy filter (EF-TEM & EELS) with resolution of 0.8eV at 200kV
3D Tomography for TEM/STEM images (Tilt range ±70 degrees)
Degas temp. range: Ambient to 300°C, ± 10°C
High resolution (HR) pole piece
JED-2300
JED-2300 SDD EDS detector (100mm2 sensor size)
Maximum resolution 133eV
Elements detectable to Beryllium
3D tomography of elemental maps
Gatan 690 Elsa ULP
Elsa Cryo-Transfer Holder (High-Tilt)

Charges: NA

Instrument Manufacturer URL:
https://www.jeol.co.jp/en/products/detail/JEM-2200FS.html

Detailed Specifications: NA