1b. ACI: X-Ray Spectroscopy\Microscopy: ACI: Park Systems, Atomic Force Microscope, NX-10

What is it?
AFM is a type of scanning probe microscopy technique that uses a probe (cantilever) to measure interactions between its fine tip with surface to provide details on three-dimensional topography or surface features.

Manufacturer: Park Systems

Model Name: NX-10

Applications: Surface imaging of materials under ambient or controlled environment / Drug interactions measurements In-situ observation of drug crystals growth / Microscopic imaging of fragile biological samples Imaging of sub-micron phases in materials / Nano-indentation for mechanical properties

Instrument Overview: The AFM system with an acoustic enclosure provides high resolution, non-destructive imaging on material surfaces with details down to molecular level. It analyses the interaction between particles and reveals surface forces that determine the bulk rheological behavior.

Technical features and specifications:
Z Scanner, AFM/SICM head (scan range): 15um
XY Scanner (scan range): 50um x 50um
Resolution: 0.05nm
Sample size: 100mm x 100mm
Thickness up to 20mm
sample weight < 500g
Field-of-view: 480um x 360um (10x objective lens)
CCD: 1 M pixel

Charges: NA

Instrument Manufacturer URL:
https://www.parksystems.com/products/small-sample-afm/park-nx10/overview

Detailed Specifications: NA