Electronic properties: Cryo-Probe Station (PSS) System (CRX-VF)

What is it?
Cryogenic probe station system

Manufacturer: LakeShore

Model Name: CRX-VF

Applications: For electrical measurement of thin film and 2/4 terminals devices with an out-of-plane filed and different measurement temperature.  

Instrument Overview: This is a cryogenic Probe Station System with Optical Microscope System for electrical measurements.

Technical features and specifications:
1. The system can load in wafer sample with size <2-inch diameters. 2. The system has 4 probe arms with high flexible XYZ travel positioning micro-manipulated stages (travel distance ≥ 2 inch (X) -1 inch (Y) -0.5 inch (Z)). 3. The system can carry out electrical measurements with variable vertical magnetic field and temperature. (±2.5T at 10K; ±2 T at 10K-400K; ±1T at 400K-500K) 4. The system provides zoomable optical microscope system for sample and probe tips loading (Visualized feature of ≤ 3um, ≥7 optical zoom times).

Charges:
NA

Instrument Manufacturer URL: https://www.lakeshore.com/

Detailed Specifications:
https://www.lakeshore.com/products/categories/overview/material-characterization-products/cryogenic-probe-stations/model-crx-vf-cryogenic-probe-station