equipment
What is it?
Hg probe CV measurement system
Manufacturer: SSM
Model Name: 495
Applications: Dielectric on Si from small pieces (2x2 cm2) up to 6, 8-inch wafers and Si are acceptable
Instrument Overview: automatic mapping system provides a variety of electrical characterization measurements for non-patterned wafers used in epitaxial silicon and front-end semiconductor process development and production
Technical features and specifications:
dielectric constant
dielectric breakdown voltage
dielectric leakage current
Charges:
Contact Admin
Instrument Manufacturer URL: NA
Detailed Specifications:
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