Metrology: A High Resolution XCT (Machine B)

What is it?
X-ray computed tomography measurement system for 3D non-destructive and inner dimensional measurements.

Manufacturer: GE

Model Name: Nanotom M

Applications: To support measurement needs from Aerospace, Automotive, Biomedical, Calibration and Testing, Electrical, Food, Government, Precision Engineering, Pharmaceutical, Semiconductor and Trading sectors

Instrument Overview: Measurement system to enhance, broaden and complement coordinate measurements with complex geometry to meet the need of the industry for 3D non-destructive and inner dimensional measurements.

Technical features and specifications:
Max. sample dia/hgt: 240 mm/250 mm Max. tube voltage/power: 180 kV/15 W Best detectability: 0.2 µm Best voxel resolution: 0.3 µm

Charges:
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Instrument Manufacturer URL: https://www.ge.com/

Detailed Specifications:
https://www.bakerhughesds.com/industrial-x-ray-ct-scanners/phoenix-nanotom-m-3d-metrology-nano-ct