Metrology Services: Material Devices & Reliability Analysis (MDRA) Services

Key Service

Material Devices and Reliability Analysis (MDRA) has the capabilities and cutting-edge facilities to conduct world-class research and development in semiconductor technology.

Applications

We provide materials and process characterization, failure analysis, and reliability testing to support our industry partners in wafer fabrication, packaging, assembly, and test.

Key Equipment

- 12" Probe station - FEI Double beam FIB - FE-SEM - Ar Ion Milling/Polisher - CSAM Sonix - Thermal Shock Chamber - ESD tester - High temperature storage chamber - Thermal Shock (liquid to liquid) - Thermal Humidity Chamber - FEI TEM (CM200) - 3D X-Ray