Surface probe microscopy: AFM (Bruker Dimension ICON)

What is it?
An atomic force microscope with elect & magnetic modes, Nano-mechanical Mapping, PiezoForce, liquid environment based on interaction between cantilever tip and sample.

Manufacturer: Bruker

Model Name: Dimension ICON

Applications:

Instrument Overview:

Technical features and specifications:
Scan size no larger than 50um
step height no more than 3um
sample size up to 8'' wafer

Charges:
NA

Instrument Manufacturer URL:

Detailed Specifications: