Surface probe microscopy: AFM - NW3 + Confocal microscope (JPK Instruments)

What is it?
A liquid conductive atomic force microscope with force spectroscopy analysis in liquid based on interaction between cantilever tip and sample. An AFM images the topography of a sample surface by scanning the cantilever over a region of interest. By using a feedback loop to control the height of the tip above the surface—thus maintaining constant laser position—the AFM can generate an accurate topographic map of the surface features.

Manufacturer: JPK Instruments

Model Name: NanoWizard 3 BioScience

Applications: 3D morphology study of any materials from semiconductor to materials to biological sample. Nanomechanical information from the sample. For example, phase-separated block copolymer, cell, and etc

Instrument Overview:
Technical features and specifications:
Scan range: 100umX100umX15um (XYZ)
Standard AFM imaging mode: contact, AC, force spectroscopy in air and liquid (water)
Special imaging mode: Quantitative Imaging mode (QI) for nanomechanical information from the sample


Charges:
NA

Instrument Manufacturer URL:

Detailed Specifications: